| 型号 | 制造商 | 描述 | 操作 |
| 8V182512IDGGREP [更多] | Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP RoHS: Compliant | pbFree: Yes | 搜索 查看资料 |
| 8V182512IDGGREP [更多] | Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP RoHS: Compliant | pbFree: Yes | 搜索 查看资料 |
| 8V182512IDGGREP [更多] | Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP RoHS: Compliant | pbFree: Yes | 搜索 查看资料 |
| 型号 | 制造商 | 描述 | 操作 |
| 8V182512IDGGREP [更多] | Texas Instruments | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device RoHS: Compliant | 搜索 |
| V62/04730-01XE [更多] | Texas Instruments | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device RoHS: Compliant | 搜索 |
| 型号 | 制造商 | 描述 | 操作 |
| 8V182512IDGGREP [更多] | Texas Instruments | Bus XCVR Dual 18-CH 3-ST 64-Pin TSSOP T/R - Tape and Reel (Alt: 8V182512IDGGREP) RoHS: Compliant | 搜索 |
